The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1985

Filed:

Sep. 07, 1982
Applicant:
Inventor:

Richard F Frazita, St. James, NY (US);

Assignee:

Hazeltine Corporation, Commack, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q / ; H01Q / ; H01Q / ;
U.S. Cl.
CPC ...
343372 ; 343351 ;
Abstract

A external feedback network for decreasing variations in a beam pointing angle of a scanning antenna array. A dedicated aperture manifold is intergral with the aperture of the scanning antenna and provides a signal which represents the beam pointing angle. The signal is detected, decoded, and converted into digital data for averaging and processing by a CPU. The processed data is then compared with a value stored in memory and any difference forms the basis of a correction signal. For application to a microwave landing system, the correction signal is used to adjust the start/stop time of the scanning commands of the antenna to remove the error without modifying the beam steering algorithm. A space-coupled monitor may also be used independent of the feedback network to provide an alarm in response to any failure of the dedicated aperture manifold, the automatic stabilization circuitry or the array system.


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