The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1985

Filed:

Jun. 18, 1984
Applicant:
Inventor:

Mitsuhiro Tokuhara, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
355 55 ; 355 57 ;
Abstract

A device for slit-scanning the surface of an original and projecting the image of the surface of the original onto a light-receiving medium comprises an imaging optical system for forming the image of the surface of the original on the light-receiving medium. The imaging optical system has means which, in a first condition, has equal imaging magnifications in orthogonal directions, i.e., the widthwise direction of the slit and the lengthwise direction of the slit and is for keeping the surface of the original and the light-receiving medium in an optically conjugate relation and which, in a second condition, has different imaging magnifications in orthogonal directions, i.e., the widthwise direction of the slit and the lengthwise direction of the slit and is for keeping the surface of the original and the light-receiving medium in an optically conjugate relation in both of the directions.


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