The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1985
Filed:
Jan. 09, 1984
Applicant:
Inventor:
Yasushi Wakahara, Yokohama, JP;
Assignee:
Tokyo Shibaura Denki Kabushiki Kaisha, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01K / ;
U.S. Cl.
CPC ...
374166 ; 324 52 ; 374177 ;
Abstract
An apparatus for detecting the local temperature variations of an object and the sites of the temperature variations comprises,
Wakahara, Yasushi. (1985). Apparatus for detecting the local temperature variations of an object (U.S. Patent No. 4533259). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4533259
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile