The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1985
Filed:
Jun. 09, 1980
Kenneth French, Merrimack, NH (US);
Robert C Kocher, Harvard, MA (US);
Alfred Piorkow, Lancaster, SC (US);
Kenneth Shaner, Towanda, PA (US);
J Thomas Smith, Acton, MA (US);
GTE Products Corporation, Stamford, CT (US);
Abstract
Apparatus for automatically measuring aperture size of apertured material includes a means for supporting and transporting the apertured material and a light source providing a light beam directed for passage through the apertured material to a light detector and is characterized by a comparator mask of alternate light transparent and opaque sectors of a given dimension and means for overlaying the apertured material with the comparator mask to provide a given length of light transparent slot and responsive to signals representing light transmitted through the given length of slot for deriving a signal representing the width of the slots of the slotted material. Also, a process for automatically measuring aperture size includes the steps of overlaying the slotted material with the comparator mask and utilizing a signal from the light detector representing light transmission of the slots of a given length to derive a signal representative of the slot width.