The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1985

Filed:

Jun. 24, 1983
Applicant:
Inventor:

Tamenori Shirai, Kure, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
3316 / ;
Abstract

A micrometer head adapted to be mounted to a measuring instrument or the like and used for measuring and precision feeding includes an adjusting ring (23) spaced a predetermined distance apart from a thimble (6). This adjusting ring (23) is connected to an intermediate tubular member (16) which is provided on a sleeve (15) coupled onto a spindle (1) in a manner so as to be rotatable relative to the sleeve (15). A coil spring (35) is confined between the adjusting ring (23) and a graduation ring (17) disposed inside the thimble (6). Rotation of the adjusting ring (23) causes the spindle (1), sleeve (15), graduation ring (17) and thimble (6) to be simultaneously moved relative to a mount fixable portion (31) adapted to be mounted to the measuring instrument or the like.


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Shirai, Tamenori. (1985). Micrometer head (U.S. Patent No. 4532711). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4532711

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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