The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1985

Filed:

Mar. 17, 1983
Applicant:
Inventor:

Kristian R Peschmann, San Francisco, CA (US);

Assignee:

Imatron Associates, South San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
378143 ; 313237 ;
Abstract

Disclosed is a target structure for use in an X-ray transmission scanner in which X-rays are generated by directing an electron beam at an X-ray generating target. The structure includes a support bracket having a recessed portion and a support surface formed in the recessed portion. A bolt extends through the bracket and maintains a target member in abuttment with the support surface which positions the target in proper alignment with an electron beam.


Find Patent Forward Citations

Peschmann, Kristian. (1985). Multiple electron beam target for use in x-ray scanner (U.S. Patent No. 4531226). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4531226

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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