The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1985

Filed:

May. 17, 1982
Applicant:
Inventor:

Henri Sadones, Paris, FR;

Assignee:

Societe d'Etude du Radant, Les Ulis Cedex, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
343 177 ; 34082577 ; 343754 ; 343909 ;
Abstract

The invention refers to the analysis of a very high frequency radiation beam of electromagnetic waves. According to the invention, a network of conductor wires is placed in the path of a beam to be analyzed, the wires being interrupted at intervals by switches. One controls the conducting state of a diode and one blocks the others and one makes the position of the diode vary electronically and sequentially in the conducting state. The return signal received on a sensor R is used by detecting the significant characteristics of that return according to the position of the diodes in the conducting state.


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Sadones, Henri. (1985). Method and device for analyzing a very high frequency radiation beam of (U.S. Patent No. 4531126). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4531126

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