The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1985

Filed:

Mar. 20, 1984
Applicant:
Inventors:

Horst Burkhardt, Truchtlaching, DE;

Alfons Ernst, Traunreut, DE;

Holmer Dangschat, Traunreut, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33 / ; 33 / ; 3312 / ; 356138 ;
Abstract

A calibration process and apparatus are disclosed for allowing a reference position to be determined at any time, independent of the momentary position of the two objects movable relative to one another to be measured. One of the two objects to be measured is decoupled from the measuring device and then either the scanning plate or the measuring graduation of the measuring device is moved until it comes into alignment with a reference mark. This scanning of a reference mark causes a counter included in the measuring system to be set at a predetermined value such as zero. From this point up to the point the scanning plate or measuring graduation is returned to the momentary starting position, the grid lines of the graduation on the graduated plate are counted. In this way, the absolute position of the momentary starting position is determined. After all components of the measuring device have been returned to the momentary starting position, the measuring position is re-established, and the working operation can be resumed.


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