The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1985
Filed:
Jul. 06, 1984
Masana Minami, Kawasaki, JP;
Kazuaki Kimura, Tokyo, JP;
Masayuki Kondo, Tokyo, JP;
Tsuneo Sasaki, Tokyo, JP;
Tokyo Shibaura Denki Kabushiki Kaisha, Kawasaki, JP;
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
An encoder for measuring devices having a code plate including binary grating patterns arranged in a given regular fashion and forming a first scale, a linear sensor including photodiode elements arranged with fixed intervals and forming a second scale disposed in parallel with the code plate, and processor means for absolute-interpolating one pitch of the first or second scale on the basis of reading data or information obtained from the linear sensor corresponding to a relative position of the patterns to the elements. When the number of the scale divisions of the first scale within a fixed range is N, the number of the scale divisions of the second scale is N+1. Accordingly, when the first scale is a main scale, the second scale is a vernier scale. The processor means detects a phase inverting point corresponding to the interpolation point on the basis of the reading data. The processor means performs the absolute interpolation by detecting the phase inverting point.