The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1985
Filed:
Apr. 18, 1980
Applicant:
Inventor:
Kenneth A Ports, Indialantic, FL (US);
Assignee:
Harris Corporation, Melbourne, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 356396 ; 356401 ;
Abstract
The numerical position relative to a reference indicia of two most nearly aligned overlapping indicia on two separate levels is multiplied by the difference in spacing of the indicia of the patterns on the two levels to determine the degree of misalignment of the levels.
Ports, Kenneth. (1985). Method of measuring misalignment between levels on a substrate (U.S. Patent No. 4529314). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4529314
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile