The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1985
Filed:
Sep. 27, 1982
Kiyofumi Matsuda, Ibaraki, JP;
Tomoaki Eiju, Ibaraki, JP;
Yuji Enomoto, Ibaraki, JP;
Yoshitaro Yoshida, Chiba, JP;
Agency of Industrial Science & Technology, Tokyo, JP;
Ministry of International Trade & Industry, Tokyo, JP;
Abstract
A device for the detection of the center of rotation of a rotating object under test comprises means for illuminating a laser beam on at least one position on the surface of the object thereby generating an interference fringe, means for subjecting the resultant reflected scattered laser beams to spectral analysis by the laser Doppler effect thereby finding the velocity of rotation of the position at which the interference fringe is formed on the surface, and means for determining the center of rotation on the basis of the velocity so found. Protection of the spectral analysis from the adverse effect of the pedestal component is accomplished by causing interference fringes to be formed at a plurality of positions on the surface of the object under test or by placing in the optical path for one of the pair of laser beams a prism capable of continuously modulating the laser frequency.