The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1985
Filed:
Feb. 04, 1983
Gregory K Brock, Auburn, WA (US);
Bruce R Knowlen, Tacoma, WA (US);
Weyerhaeuser Company, Tacoma, WA (US);
Abstract
The invention is a method and apparatus for non-contact measurement of the length and height or diameter of geometrically regular objects. The objects enter a first measurement station where horizontally opposed echo ranging transducers make sequential differential measurements to determine the length and transverse position of the object. Position information is sent to a microprocessor. The object is then advanced under a transverse array of downwardly oriented echo ranging transducers. The microprocessor preferrably selects the single transducer located most closely to the mid-length position of the object to make a height or diameter measurement. In the case of cylindrical objects, the object should be oriented with its axis parallel to a line projected between the opposed length measuring transducers. As the object is moved by the diameter sensing transducer, the microprocessor selects the measurement indicating the shortest distance between the object and the transducer. Diameter of the object can then be readily determined. The invention is particularly well adapted for measurement of objects that may be randomly located across a moving conveyor system.