The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1985
Filed:
Jul. 29, 1983
Harry R Meline, Minnetonka, MN (US);
MTS Systems Corporation, Eden Prairie, MN (US);
Abstract
An extensometer is used for measuring axial and diametral strains in a material test specimen. The extensometer comprises an assembly of extensometer sections positioned on diametrally opposite sides of the specimen with specimen engaging points spaced axially along the specimen. The extensometer assembly is arranged so that the two extensometer sections will average the axial strain measured by the two extensometer sections. Also, if desired, the two extensometer sections may provide an indication of the average change in diameter of the specimen at the location of the upper contact points and at the location of the lower contact points of the extensometer sections on opposite sides of the specimen. The support system between the extensometer sections provides for the necessary degrees of freedom to provide measuring only in the axis desired, and sufficient restraint in other axes to insure that accurate measurements are obtained.