The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1985
Filed:
Aug. 30, 1982
Ronald T Sheehan, Lancaster, PA (US);
E William Rowland-Hill, Lancaster, PA (US);
Carl E Bohman, New Holland, PA (US);
Sperry Corporation, New York, NY (US);
Abstract
The adjustment of operating parameters such as the sieve opening, concave opening, chaffer opening, rotor speed and/or fan speed is/are accomplished under the control of a microprocessor operating in response to the striking of keys on a keyboard. The combine harvester operator may select a particular parameter for adjustment by striking a key corresponding to that parameter. The desired setting of the selected parameter is then keyed into the keyboard and an ADJUST key struck to activate the adjustment process. Alternatively, the operator may strike a key corresponding to the crop to be harvested, a further key corresponding to the ambient moisture level of the crop, and then the ADJUST key. In this case the microprocessor reads from a stored table the values for adjusting all parameters so as to obtain a satisfactory sample and a maximum yield for the crop being harvested. The microprocessor sends signals to actuators for adjusting the various parameters and transducers sense the various parameters and provide information to the microprocessor for determining when the parameters have been adjusted to the selected values. A visual display is provided so that the operator may monitor the parameters and also observe entries keyed in at the keyboard.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile