The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1985
Filed:
Dec. 08, 1982
Cornelis M van Uijen, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention proposes a method and a device in which resonance signals (generated for NMR imaging) are sampled in the presence of a (semi-) static and a time modulated gradient magnetic field, the gradient direction of the fields applied being mutually perpendicular. The resonance signal is conditioned prior to the start of sampling. The sampled signals are associated with spatial frequencies (i.e. points in a spatial frequency space (k.sub.x, k.sub.y) which is the (2-D) Fourier transform of the actual (x, y) space), which are determined by the applied gradient fields. The (semi-) static gradient field always produces an increase (for example, in k.sub.x), while the time modulated gradient field always produces an image frequency which lies between two limits (k.sub.y and k.sub.y +k.sub.y). Consequently, the invention enables the determination of data in an entire band in the (k.sub.x, k.sub.y) space; this is in contrast with the present state of the art (DE 26.11.497) where data can be collected only along a straight line (k.sub.x or k.sub.y is constant), or on the entire region of interest (the total k.sub.x , k.sub.y space). The method and device according to the invention are also applicable for 3-D imaging of 3-D objects.