The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1985
Filed:
May. 17, 1982
David P Rogers, Clifton Park, NY (US);
Donald J Geisel, Clifton Park, NY (US);
Testamatic, Incorporated, Latham, NY (US);
Abstract
A high speed, low mass positioning apparatus is provided for positioning a test probe or other like item at any desired point within an x-y plane. The apparatus comprises a first axis of movement mechanism for positioning the item along one axis of movement and a second axis of movement mechanism for positioning the item along the remaining transverse axis of movement. Both of the axis of movement mechanisms comprise motor driven pulley wheel and drive cable arrangements arrayed around the outer periphery of the x-y planar surface area within which it is desired to position a test probe, tool or other like item. A light inflexible track member is secured between and carried by two spaced-apart movable trucks and is movable therewith in either direction along the said one axis of movement. A small lightweight movable carrier is movably supported on the track member and is movable therealong in either direction. The remaining axis of movement mechanism is arranged to move the small lightweight movable carrier back and forth in either direction along the track member. One side of a movable fine wire loop is secured to and moved by the small lightweight movable carrier and a test probe or other like item is secured to and movable with the other side of the movable fine wire loop whereby the test probe or other item can be positioned at any desired point within the planar x-y surface area. The apparatus is designed to be mounted within the interior of a substantially airtight, environmentally controlled test chamber.