The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1985
Filed:
Mar. 05, 1982
Wilbur I Kaye, Corona del Mar, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
Methods for stray light measurement and compensation in spectrophotometers are disclosed. In one exemplary embodiment, stray light is determined as a convolution of a selected detected radiant power spectrum and a monochromator slit function. Such a stray light measurement may be made with or without the sample in an optical path between a source and detector within the spectrophotometer. When made with the sample in the optical path, the resulting stray light measurement may be used to compensate sample absorbance or transmittance measurements. In accordance with another embodiment of the present invention, sample absorbance or transmittance may be compensated in a method including measuring sample detected radiant power at a wavelength outside an interval of significant detected radiant power within which a sample measurement compensated for stray is desired.