The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1985

Filed:

Jul. 21, 1983
Applicant:
Inventors:

Charles A Cockrum, Goleta, CA (US);

Joan K Chia, Santa Barbara, CA (US);

James F Kreider, Santa Barbara, CA (US);

Assignee:

Hughes Aircraft Company, El Segundo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
357 71 ; 357 61 ; 357 30 ; 357 65 ; 357 68 ; 357 232 ;
Abstract

Metallic contacts to compound semiconductor devices which employ a native oxide for passivation are provided. The metallic contacts of the invention comprise at least two metal layers: a first layer making non-rectifying contact with the semiconductor surface and providing a diffusion barrier and a second layer thereon comprising an easily oxidizable metal. A low resistivity metal layer may optionally be interposed between the two metal layers for improved conductivity. The metallic contact is formed prior to passivation. The diffusion barrier layer prevents diffusion of potentially deleterious materials into the semiconductor, while exposed portions of the oxidizable metal form an insulating oxide during anodic passivation in an electrolyte. The insulating oxide prevents disruption of the electric field distribution in the electrolyte, thereby eliminating passivating oxide and device non-uniformities commonly encountered in the formation of prior art metallic contacts and providing more uniform semiconductor oxide thickness.


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