The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1985

Filed:

Sep. 10, 1982
Applicant:
Inventors:

James B Breckinridge, La Canada, CA (US);

Fred G O'Callaghan, Mission Viejo, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356353 ;
Abstract

State of the art Fourier transform spectrometers are useful scientific tools. But, they are very complex precision electro-optical-mechanical instruments. To simplify the instrument, the need for a mechanical slide mechanism to create a path difference has been eliminated by the use of retro-reflecting mirrors (16, 18) in a monolithic interferometer assembly (11) wherein the mirrors (16, 18) are not at 90 degrees to the propagation vector (29, 43) of the radiation (27), but rather at a small angle (49). The resulting interference fringes (51, 53) create a double-sided interferogram (33) of the source irradiance distribution which is detected by a charge-coupled device (CCD) array (23). The position of each CCD pixel (25) in the array is an indication of the path difference between the two retro-reflecting mirrors (16, 18) in the monolithic optical structure. The Fourier transform of the signals generated by the CCD array (23) provide the spectral irradiance distribution of the source. For imaging, the interferometer assembly (11) scans the source of irradiation by moving the entire instrument, such as would occur if it was fixedly mounted to a moving platform, e.g., a spacecraft. During scanning, the entrance slot (21) to the monolithic optical structure send different pixels to corresponding interferograms detected by adjacent columns of pixels at the CCD array (23).


Find Patent Forward Citations

Breckinridge, James. (1985). Integrated optics in an electrically scanned imaging fourier transform (U.S. Patent No. 4523846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4523846

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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