The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1985

Filed:

Dec. 06, 1982
Applicant:
Inventors:

Michel M Delhaye, Villeneuve d'Ascq, FR;

Paul A Dhamelincourt, Anvoeullin, FR;

Edouard F da Silva, Auneuil, FR;

Jacques H Barbillat, Villeneuve d'Ascq, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350-63 ; 350527 ;
Abstract

The present invention concerns a device optimizing the coupling of two optical systems for the observation and analysis of objects, one of the systems producing the illumination of a point on the object being studied while the other produces the image of that point in an analyzer. The device is characterized by the fact that it contains a coupling optic 10 redirecting on the principal optical axis of the second system 12 a beam transmitted by the first system 11 even when the beam is located outside of the principal axis of that first system. Applicaiton is to spectral analysis, especially by microscope or telescope.


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