The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1985
Filed:
Oct. 03, 1983
Thomas Derkacs, Mayfield Village, OH (US);
Istvan M Matay, North Royalton, OH (US);
Stephan D Murphy, East Cleveland, OH (US);
John Touhalisky, Eastlake, OH (US);
TRW Inc., Cleveland, OH (US);
Abstract
A first array (A) of ultrasonic transducers transmits ultrasonic shear waves circumferentially around an examined cylindrical object (110). A second array (B) transmits ultrasonic shear waves axially along the examined object. Triggering pulses from a triggering amplifier (22) are switched by a multiplexer (24) to each individual transducer of the first and second arrays. As one of the transducers assumes the role of a transmitting transducer and transmits an ultrasonic wave, the other transducers of the first and second arrays assume a receiving mode to receive reflected ultrasonic components. A wave travel timer (26) measures the duration for an ultrasonic wave to be transmitted from the transmitting transducer to a defect and for a reflected component to propagate from the defect to the receiving transducer. A microprocessor (20) tri-angulates or otherwise computes the location and orientation of a reflective defect from the measured travel time, the spatial relationship of the transmitting and receiving transducers, and the direction of propagation of the transmitted ultrasonic wave.