The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1985
Filed:
Sep. 20, 1982
Klaus Herzog, Oberkochen, DE;
Carl-Zeiss-Stiftung, Heidenheim/Brenz, Oberkochen, DE;
Abstract
This invention contemplates a rapid method of calibrating probe-pin combinations, such as star probes or rotary-swing probes, which method is applicable when the probe system forms part of or is coupled to the control system of a measuring machine wherein a self-centering probe of workpieces is possible. The calibration procedure employs a calibration standard having a plurality of probe-centering elements distributed over its surface and facing in different directions, the positional geometry of these elements being stored in the computer of the measuring machine. Each of the individual probe balls is successively introduced into a centering element which is accessible. Thereupon, the position of each ball-center point is determined in the computer, from the stored positional data and the pre-established diameter of corresponding probe balls.