The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 1985
Filed:
May. 26, 1983
Charles E Lindig, Huntington Bay, NY (US);
Robert W Brandstetter, Levittown, NY (US);
Adrian R Doucette, Garden City, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
An optical notching or filtering system in which a beam of optical radiation is passed through the optical filtering means a multiplicity of times. The optical filtering means has an optical Fourier transform means, a spatial filter, optical inverse Fourier transform means, and a reflector array. After an input optical signal beam undergoes a filtering pass by being directed through the transform means, the filter, and the inverse transform means, the reflector array re-introduces the beam for a multiplicity of subsequent filtering passes. Four embodiments of the system of the invention having various configurations of the reflector arrays for use with one- and two-dimensional spatial filters are disclosed. The various embodiments are set forth as being used in a heterodyning optical notching filter system.