The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1985
Filed:
May. 26, 1982
Mitutoyo Mfg. Co., Ltd., Tokyo, JP;
Abstract
An optical measuring device wherein a workpiece being measured is interposed between a parallel scanning ray beam generating source and a light receiving element, and dimensions of the workpiece being measured is measured from the time length of a dark portion or a bright portion generated due to the obstruction of the parallel scanning ray beams by the workpiece being measured. The aforesaid parallel scanning ray beam generating source comprises: a beam generator; a rotary mirror for reflecting and converting the incident ray beams into rotary scanning ray beams; a ray beam transmitting mechanism for dividing the ray beams from the beam generator in terms of time or quantity and causing the ray beams thus divided to incide into the rotary mirror at a predetermined incident angles; and a collimator lens for converting the rotary scanning ray beams from the rotary mirror into parallel scanning ray beams.