The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1985
Filed:
Dec. 22, 1982
Mitutoyo Mfg. Co., Ltd., Tokyo, JP;
Abstract
An optical measuring device comprising a parallel scanning ray beam generator, condensing means for condensing said parallel scanning ray beams after said parallel scanning ray beams have passed through a workpiece being measured, and a single light receiving element for sensing the brightness of said scanning ray beams condensed by said condensing means to convert the same into an electric signal, whereby the dimensions of the workpiece being measured are measured from the time length of a dark portion or a bright portion generated due to the obstruction of said parallel scanning ray beams by the workpiece being measured, which has been interposed between the parallel scanning ray beam generator and said light receiving element, a plurality of light emitting elements are arranged in opposed relations to the scanning scope of the parallel scanning ray beams, an output from the light receiving element during a single scanning time is time-shorn in accordance with the number of the light emitting elements to thereby cause the light emitting element or elements to emit light in accordance with the position of the workpiece being measured with respect to the scanning scope.