The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1985
Filed:
Sep. 11, 1981
Outokumpu Oy, Helsinki, FI;
Abstract
Disclosed is a method and an apparatus for analyzing pieces of ore for the purpose of sorting. Each piece falling by the analyzer is irradiated individually by means of two gamma radiation sources operating at different energy levels so selected that, as to the scattering effect, at one level the Compton effect is predominant and at the other level the Compton effect and the photoelectric effect compete with each other. The former effect is strongly dependent on the ordinal number of the element and, thus, by detecting with at least one detector the scattering intensities produced with the said two sources of radiation and comparing the scattering intensities with each other, the proportion of heavy elements in the ore piece can be determined and the ore piece can be classified on the basis thereof. For example, one energy dispersively operating scintillation detector can be used for detecting the scattered radiation.