The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1985
Filed:
Mar. 15, 1982
Lorne A Davis, Jr, Houston, TX (US);
Helen K Haskin, Houston, TX (US);
Texaco Inc., White Plains, NY (US);
Abstract
A method of two dimensional chemical flood testing includes evacuating a porous medium contained in a test cell. The porous medium in the test cell is irradiated with a beam of microwave energy at a plurality of predetermined locations on said test cell. The microwave energy that has passed through the porous medium at each location is detected at the location. The porous medium in the test cell is filled with brine. The irradiating and detecting steps are repeated, the porous medium is then flooded with crude oil, or a substitute, and again the irradiating and detecting steps are repeated. The porous medium is flooded with brine and again the irradiating and detecting steps are repeated. A calibration curve for each location is derived from the detected microwave energy at the location from the prior irradiating and detecting steps. The chemical flood system is tested by flooding the porous medium with the chemical flood system at a predetermined flow rate during which time the irradiating and detecting steps are repeated periodically so that the test cell is periodically scanned in two directions by microwave energy. A two dimensional pattern of the chemical flood is derived for each scan in accordance with the detected microwave energy at each location for the scan and the calibration curves.