The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 1985
Filed:
Oct. 27, 1982
Richard D Albert, Danville, CA (US);
Other;
Abstract
The distribution of one or more chemical elements within an object is detected by directing primary x-rays to successive points along a scan path on the object and by analyzing the energies of fluorescent x-rays emitted from the successive points to identify characteristic x-rays of the element. In the preferred form, a moving primary x-ray origin point is established by sweeping an electron beam along a broad target plate in a raster pattern corresponding to the desired scan path on the object. A collimator between the target plate and the object has x-ray transmissive zones alternated with x-ray absorbent zones to assure that primary x-rays from the moving origin point reach only corresponding successive points on the object. High precision with a minimum of structural complication is realized by scanning electronically rather than with a mechanical system.