The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 1985
Filed:
Jul. 27, 1982
Applicant:
Inventors:
Kenneth B Stackhouse, San Jose, CA (US);
William D Hill, San Jose, CA (US);
Assignee:
General Electric Company, San Jose, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06M / ;
U.S. Cl.
CPC ...
377 29 ; 377 19 ; 377107 ; 377 39 ; 371 61 ; 371 62 ;
Abstract
A testable time delay apparatus includes means for testing component operation during any stage of system function and means for continuously monitoring and testing component functions. The device is particularly useful in critical process control applications such as in a nuclear reactor control system.
Stackhouse, Kenneth. (1985). Testable time delay (U.S. Patent No. 4519090). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4519090
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile