The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1985

Filed:

May. 03, 1982
Applicant:
Inventors:

Karl M Fant, Minneapolis, MN (US);

Richard A Fundakowski, Saint Paul, MN (US);

Tod S Levitt, Minneapolis, MN (US);

John E Overland, Plymouth, MN (US);

Bindinganavle R Suresh, New Brighton, MN (US);

Franz W Ulrich, Minneapolis, MN (US);

Assignee:

Honeywell Inc., Minneapolis, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ; G06G / ;
U.S. Cl.
CPC ...
364552 ; 364469 ; 382 22 ; 382 54 ;
Abstract

A method and apparatus relating to the real time automatic detection and classification of characteristic type surface imperfections occurring on the surfaces of material of interest such as moving hot metal slabs produced by a continuous steel caster. A data camera transversely scans continuous lines of such a surface to sense light intensities of scanned pixels and generates corresponding voltage values. The voltage values are converted to corresponding digital values to form a digital image of the surface which is subsequently processed to form an edge-enhanced image having scan lines characterized by intervals corresponding to the edges of the image. The edge-enhanced image is thresholded to segment out the edges and objects formed by the edges are segmented out by interval matching and bin tracking. Features of the objects are derived and such features are utilized to classify the objects into characteristic type surface imperfections.


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