The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1985

Filed:

Aug. 29, 1983
Applicant:
Inventors:

Hiroshi Tanaka, Tokyo, JP;

Tetsuo Kimura, Tokyo, JP;

Seiichi Tanaka, Chiba, JP;

Takashi Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
340514 ; 340511 ; 340515 ;
Abstract

When a receiver supplies both an address signal and a test instruction signal to a given terminal unit, a test voltage generator forming a sensor test circuit of this terminal unit supplies a predetermined test voltage to a corresponding sensor. This sensor generates an analog signal obtained by superimposing the test voltage on the normally detected voltage. The analog signal is A/D-converted, and a resultant digital signal is received by the receiver, thereby allowing a test for operating conditions of any sensor at the site of the receiver. The test voltage generator may generate a plurality of stepwise voltage components to readily check operating characteristics (e.g., overload characteristic) of the sensor.


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