The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1985
Filed:
Dec. 03, 1981
Applicant:
Inventor:
Jacques E Ludman, Westford, MA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356363 ;
Abstract
An interferometric system for general use to measure the angular relationship of two surfaces of the same object, or of different objects, or the relative angular change of one surface with respect to another. This device uses coherent light, a set of mirrors aligned as a Ludman Interferometer, and a reference pair of mirrors with a well known fixed angle similar to that of the angle of the sample pair to be measured. In preferred embodiments, the fixed angle mirror pair has a fine tilt adjustment to facilitate the interpretation of the output fringe pattern.