The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1985

Filed:

Jun. 25, 1982
Applicant:
Inventors:

Ken-ichi Nakahashi, Hachioji, JP;

Shin-ichi Mihara, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350515 ; 250201 ;
Abstract

An in-focus detector for a binocular stereomicroscope having a pair of left- and right-hand observation optics includes a pair of beam splitters, each disposed intermediate the objective lens and the eyepieces of the respective observation optics. The first one of the beam splitters introduces the optical image of a mark into one of the observation optics, which then focuses it on an object being observed. The image is then reflected by the object and passes through the other observation optics to be reflected by the second beam splitter so as to be directed externally of the observation optics and focussed on a photoelectric transducer element, which is effective to detect an in-focus condition.


Find Patent Forward Citations

Loading…