The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1985

Filed:

Sep. 20, 1983
Applicant:
Inventor:

Allan M Hodge, San Diego, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
7386444 ;
Abstract

A hay probe for taking samples from bales of hay includes a pair of heavy duty handles, a central mounting assembly, and an elongated probe, in the order of about a foot in length, and having an inner diameter in the order of about 3/8ths of an inch. Attached to the mounting assembly opposite to the probe tube is an impermeable sampling container such as a Mason jar. An elongated tamping rod is provided for pushing the contents of the probe tube into the container. Standardized samples may be obtained using, for example, 15 samples, which will substantially fill a normal one pint Mason jar.


Find Patent Forward Citations

Hodge, Allan. (1985). Standardized sampling hay probe (U.S. Patent No. 4516438). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4516438

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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