The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1985

Filed:

May. 27, 1980
Applicant:
Inventors:

Peter W Smith, Colts Neck, NJ (US);

Walter J Tomlinson, III, Holmdel, NJ (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350 9613 ; 350 9634 ; 350354 ;
Abstract

Several types of nonlinear characteristics are provided in an optical device wherein at least two optical materials are constructed to provide a waveguide structure. At least one of the materials has a dominant nonlinear characteristic over the length of the waveguide that is commonly referred to as the Kerr effect. The index of refraction in this material is a function of the light intensity in the waveguide. By selecting materials that provide either positive or negative Kerr coefficients, and by constructing the device with the nonlinear material either as the core or as the cladding layer, power output versus input characteristics that exhibit both limiting and amplification can be provided. A bistable characteristic is provided in one of the embodiments by terminating the waveguide structure with a mirror. Specific embodiments using carbon disulfide and polydiacetylene as the nonlinear materials are disclosed.


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