The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1985

Filed:

Dec. 02, 1981
Applicant:
Inventors:

John D Hollinger, Miami, FL (US);

Raul I Pedroso, Miami, FL (US);

Assignee:

Coulter Corporation, Hialeah, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
209-31 ; 209571 ; 209906 ; 356 39 ; 356 73 ; 356246 ;
Abstract

Disclosed is a flow-through, particle analyzer and sorter apparatus for simultaneous optical and electrical impedance measurements on a stream of particles, comprising a flow cell having a pair of channels fluidly connected by a particle sensing aperture, through which the particles pass and are analyzed; a nozzle mounted at the end of the downstream channel so as to define a flow chamber; a sheath liquid which is introduced at the bottom of the flow chamber to hydrodynamically focus the particle stream and to jet the same in a liquid jet from the nozzle; and a system for creating droplets from the liquid jet and for thereafter sorting the droplets.


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