The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1985
Filed:
Feb. 01, 1984
Peter Renzel, Duren, DE;
Klaus Kroesen, Bonn, DE;
Krautkramer-Branson, Inc., Lewistown, PA (US);
Abstract
The invention relates to an ultrasonic test instrument, in which a receiver amplifier is controlled in dependence upon time by means of a depth compensation signal or else the ultrasonic signal amplified independently of the depth is evaluated by means of a time-dependent variable threshold signal. The depth compensation signals and the time-dependent threshold signals are derived from the same digital signal values stored in a main memory. The test instrument comprises a microprocessor by means of which the digital signal values for each material requiring testing are automatically measured by the instrument itself in conjunction with whichever test probe is used provided a corresponding test block of this material is available. The microprocessor also controls the circuit generating the depth compensation and threshold signals, so that depending upon the type of operation selected the cathode ray tube can display either the ultrasonic echo responsive signals corrected as a function of depth or the uncorrected ultrasonic signals are shown together with the time-dependent threshold value.