The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 1985
Filed:
Jul. 30, 1982
Yuji Kobayashi, Fujisawa, JP;
Takao Okada, Kawasaki, JP;
Dai Nippon Printing Co., Ltd., Tokyo, JP;
Ikegami Tsushinki Co., Ltd., Tokyo, JP;
Abstract
An automatic surface inspection system includes a surface scanner for scanning the inner surface of a paper cup rotated about its own axis and a preprocessing section receiving a picture element signal from the surface scanner for outputting a digital picture element signal to a reference axis setting circuit for detecting a reference axis in the sub-scanning direction. A first and a second discriminating circuit receives the digital picture element signal for conducting a surface inspection. The first circuit handles the main scanning direction while making necessary masking treatment in the main scanning direction and the second discriminating circuit handles the sub-scanning direction while making necessary masking treatment in the sub-scanning direction. A mask pattern circuit has a reference memory adapted to supply the discriminating circuit with pattern information. Thereafter, the respective discriminating circuits perform masking processing in real time on the basis of mask pattern information and corresponding portion from the reference memory so as to a total discriminating circuit decides whether or not the surface of said object inspected is acceptable or defective.