The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 1985
Filed:
Aug. 30, 1982
Robert J Bellar, Watsonville, CA (US);
William G Golden, San Jose, CA (US);
David D Saperstein, Foster City, CA (US);
Ashok Vats, San Jose, CA (US);
International Business Machines, Armonk, NY (US);
Abstract
A method and apparatus for simultaneously recording multiple Fourier Transform Infrared (FT-IR) signals using an interferometer. The analog signals are coupled to switching means which is operable in response to a first control signal for synchronizing the operation of the interferometer and the control circuits and a second control signal for defining data acquisition intervals to direct the sampled data of the analog input signals over a circuit path including Sample and Hold and Analog to Digital Conversion circuits to a processor for storing the digital data corresponding to the analog input signals. The switching means is operated so that samples of the analog input signals are taken in sequence and stored in sequential storage locations in interleaved fashion. The processor is operable under program control to access the digital data so that all data samples for the same input signals are separated to produce an interferogram for each of the input signals. These interferograms can then be Fourier Transformed to produce spectra in the usual manner.