The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1985
Filed:
Sep. 22, 1982
Takabumi Fumoto, Kanagawa, JP;
Fuji Electric Company, Ltd., both of, JP;
Fuji Electric Corporate Research and Development, Ltd., both of, JP;
Abstract
An infrared film thickness gage for continuous on-line thickness measurement of a plastic film produced by a film blowing process into a tube shape has an infrared source with generally uniform directional radiation characteristics and is concentrically positioned inside the film tube. A photodetector is positioned outside the film tube in confronting relation to the source and receives the infrared rays of different reference and measurement wavelengths after the infrared rays have passed through the tube. Converting means receives the output of the photodetector, and since the film has different known attenuation coefficients for the different wavelengths, the thickness of the film can be determined. By using an infrared source having uniform directional characteristics and a filter to filter out instantaneous background light, measurement errors are substantially reduced or eliminated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile