logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4508832 B1

PDFFull Text
Date of Patent:
Apr. 02, 1985

Filed:

Jun. 18, 1982

Ellipsometrically measuring rate of optical change in immunoassay

Applicant:
Inventors:

Timothy J Carter, Geneva, CH;

Claus Dahne, Onex, CH;

Assignee:

Battelle Memorial Institute, Carouge, CH;

Attorneys:

Ross; Karl F.

Dubno; Herbert

Primary Examiner:

Sidney Marantz

Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436517 ; 356246 ; 356364 ; 436527 ; 436805 ;
Abstract

A layer of bioactive molecules is coated on a dielectric substrate and is contacted with a solution to be analyzed containing a complex conjugate of said molecule. The rate of complexion of said conjugate moiety with the layer which is a function of its concentration in the analyte is measured by optical means and correlated with corresponding rates obtained from standard reference measurements, thus providing data for determining the unknown concentration of said conjugate moiety in the solution to be analyzed.

Find Patent Forward Citations

Carter, Timothy. (1985). Ellipsometrically measuring rate of optical change in immunoassay (U.S. Patent No. 4508832). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4508832

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…