The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 1985

Filed:

Aug. 13, 1982
Applicant:
Inventor:

Toshiaki Yanagi, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D05B / ;
U.S. Cl.
CPC ...
11212112 ;
Abstract

A testing device for an automatic sewing machine wherein a succession of stitches are formed through variation in relative position between a needle and a work holder according to a batch of positional data stored in a memory. The device comprises a control circuit for controlling to operate stepper motors to effect variation in the relative position without reciprocating movements of the needle. The control circuit includes first control means for varying the relative position every time the positional data for each of the stitches is executed, second control means for varying the relative position every time the positional data for a plural number of the stitches are continuous executed at one time, and a selector for selectively actuating one of the first and second control means to select one of two modes in which the stored positional data are tested for verification.


Find Patent Forward Citations

Yanagi, Toshiaki. (1985). Testing device for an automatic sewing machine (U.S. Patent No. 4506612). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4506612

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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