The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 1985
Filed:
Aug. 05, 1982
Martin Allemann, Ottikon, CH;
Hanspeter Kellerhals, Uster, CH;
Spectrospin AG, Zurich-Fallanden, CH;
Abstract
In the calibration of ion cyclotron resonance spectrometers there may be used the first upper sideband of the resonance frequency of known sample substances because it was found that the frequency of the first upper sideband is approximately equal to the true cyclotron resonance frequency .omega..sub.c =(q/m)B. If only one line is available for the calibration, the frequency .omega..sub.R of the first upper sideband is set equal to the true cyclotron resonace frequency .omega..sub.c in the relation ##EQU1## which is used for calibration. If multiple lines are available, a more exact calibration is possible by using the relation ##EQU2## where .omega..sub.cor is a correction frequency. The effective resonance frequency .omega..sub.eff is separated from the upper sideband by a value .DELTA..omega. which, in a good approximation, is independent of m/q. In determining the mass by way of the carrier line, an equation of the above type may be used wherein the displacement of the carrier line with respect to the sideband is taken into account by the term .omega..sub.cor.