The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1985
Filed:
Jan. 05, 1982
Shigeru Yabuuchi, Tokyo, JP;
Takeyuki Endoh, Kodaira, JP;
Kazuyuki Kodama, Hachioji, JP;
Jushi Ide, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to deliver an input signal of each operation cycle after a desired time delay, there are disposed data memory means for storing the input signal, counter means for appointing write addresses of the data memory means, and address memory means for appointing read addresses of the data memory means. The address memory means is divided into partial memory areas equal in number to time delay elements, whereupon while sampling the input signal at a predetermined sampling period and changing the count value of the counter means one by one for each of the desired time delay elements at each sampling point, the variations of the input signal in a sampling interval between the particular sampling point and the adjacent sampling point are successively written into the memory means. Further, while changing the contents of the partial memory areas corresponding to the desired time delay element to the number of the time delay elements in each sampling interval, the variations in a sampling interval preceding a predetermined sampling number to the particular sampling interval are successively read out from the memory means. The input signal of each operation cycle in the preceding sampling interval is presumed by an interpolation operation based on the variation and the sampling period, and the result is used as an output signal of the desired time delay element.