The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1985
Filed:
Apr. 30, 1982
Thomas H Di Stefano, Bronxville, NY (US);
Arnold Halperin, Peekskill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The tester and method for nondestructively detecting nonlinearity faults in conductors includes the application of a composite AC and DC drive signal to the device under test in such manner that nonlinearities in the device under test produce fault signals including second harmonics, due to local changes of resistance caused by ohmic heating. Electronic filters are used to select out and amplify the second harmonic only, eliminating the direct current and fundamental frequency components of the initial test pulse, plus third and subsequent harmonics. The filtered second harmonic signals from the device under test are then phase-compared to a phase-shifted second harmonic signal produced by a frequency doubler from the test signal generator oscillator to cancel out the second harmonic signals from the good conductor; the remaining phase anomaly signals control a threshold detector remaining to provide fault indication.