The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 1985

Filed:

Sep. 23, 1982
Applicant:
Inventors:

Hong H Lee, Gainesville, FL (US);

Dennis J Miller, Haslett, MI (US);

Assignee:

University of Florida, Gainesville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K / ; G01K / ;
U.S. Cl.
CPC ...
374-7 ; 73204 ; 422 88 ; 436 37 ;
Abstract

A method of determining the proportion of the surface area of a coated substrate that is covered by the coating comprising passing a known volume of an adsorbate gas under controlled flow conditions over a coated substrate and measuring the volume of adsorbate gas adsorbed on the surface area at different temperatures between the liquefaction temperature of the adsorbate gas and ambient temperature; similarly measuring the volume of the adsorbate gas adsorbed on the surface area of the substrate in the absence of the coating in the same temperature range; similarly measuring the volume of the adsorbate gas adsorbed on said coating in the absence of said substrate in the same temperature range; comparing the above volumes at identical temperatures and calculating therefrom the proportion of surface area of said substrate covered by said coating; and an apparatus for practicing said method. This method in this apparatus is especially useful in measuring the surface area of catalytic material on a supported catalyst.


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