The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 1985

Filed:

Oct. 27, 1982
Applicant:
Inventor:

Graham H Hilton, Lovedean, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
2502 / ; 250572 ; 250562 ; 209534 ;
Abstract

A method of detecting the condition of a rectangular sheet (8), comprising feeding the sheet, e.g. by belts (2, 4), through a checking station (adjacent to II--II), the direction of feeding (6) being along the length or the width of the sheet; deflecting, e.g. by stationary guide rails (10a, 12a), a portion of a side edge of the sheet at the checking station relatively to the remainder of a zone of the sheet (8) lying adjacent to a line through the checking station transverse to the direction of feeding, the direction of deflection of the deflected portion being orthogonal to the line and to the direction of feeding, so that the deflected portion is stretched along the direction of feeding; and subjecting the deflected portion to a beam of radiation directed from means (14a) towards sensing means (16a) and intercepted by the deflected portion, whereby any substantial tear from the side edge into the deflected portion will be opened, and will be revealed by the sensing means receiving radiation through the opened tear.


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