The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 1985

Filed:

Jul. 06, 1982
Applicant:
Inventors:

John G Gualtieri, Oceanport, NJ (US);

John R Vig, Colts Neck, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2502 / ; 250233 ;
Abstract

Methods are shown for deducing the point of impingement of a beam, such as particle or electromagnetic beam, on a planar detector which is much larger than the beam cross-section. The methods involve chopping the beam before it reaches the detector by means of a chopper which periodically obscures the field of view of the detector as a known function of the chopper motion, and then determining the point of impingement from output measurements of the detector and from the known geometry of the chopper and the detector.


Find Patent Forward Citations

Gualtieri, John. (1985). Techniques for locating beams within large area detectors (U.S. Patent No. 4493991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4493991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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