The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 1985

Filed:

Sep. 22, 1982
Applicant:
Inventor:

George O Reynolds, Waban, MA (US);

Assignee:

Honeywell Inc., Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 250201 ; 355 55 ;
Abstract

A three slit interferometric focus control device capable of focal positioning accuracies on the order of 300 angstroms. The device includes a zero path Michelson interferometer with reference and movable legs comprising, respectively, an annular reference mirror and the surface to be brought into position of best focus. A three slit plate positioned between the beamsplitter and energy detection device allows interference of light reflected off the movable and reference surfaces, creating an amplitude modulation signal. The energy detection device will measure a minimum energy intensity at the position of best focus.


Find Patent Forward Citations

Reynolds, George. (1985). High sensitivity focal sensor for electron beam and high resolution (U.S. Patent No. 4493555). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4493555

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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