The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 1985
Filed:
Sep. 09, 1982
Vishwani D Agrawal, New Providence, NJ (US);
Melvin R Mercer, Warren, NJ (US);
AT&T Laboratories, Murray Hill, NJ (US);
Abstract
A large scale sequential integrated circuit is made amenable to scan design testing by the inclusion of special multiplexing and storage circuits which respond to a pair of test control pulses to reconfigure the circuit to include one or more shift registers and to step the scan test data through the shift registers. In particular, the pair of test control pulses are applied to the two terminals to which, in normal operation, are applied the clock pulses which are used to control the storage elements and which, in such operation, are never both simultaneously high. To initiate the scan test operation, these test control pulses are made simultaneously high and the circuitry responds to such conditions.